"Self-Test Library Generation for In-Field Test of Path Delay Faults."

Lorena Anghel et al. (2023)

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DOI: 10.1109/TCAD.2023.3268210

access: closed

type: Journal Article

metadata version: 2025-11-02

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Lorena Anghel, Riccardo Cantoro, Riccardo Masante, Michele Portolan, Sandro Sartoni, Matteo Sonza Reorda:
Self-Test Library Generation for In-Field Test of Path Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4246-4259 (2023)

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