"Concurrent test for digital linear systems."

Ismet Bayraktaroglu, Alex Orailoglu (2001)

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DOI: 10.1109/43.945308

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ismet Bayraktaroglu, Alex Orailoglu:
Concurrent test for digital linear systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(9): 1132-1142 (2001)

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