"Topological Heuristics for Scan Test Overhead Reduction."

Avijit Chakraborty, Duncan M. Hank Walker (2023)

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DOI: 10.1109/TCAD.2022.3212643

access: closed

type: Journal Article

metadata version: 2023-06-02

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Avijit Chakraborty, Duncan M. Hank Walker:
Topological Heuristics for Scan Test Overhead Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(6): 2043-2054 (2023)

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