"Electrical model of the floating gate defect in CMOS ICs: implications on ..."

Víctor H. Champac, Antonio Rubio, Joan Figueras (1994)

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DOI: 10.1109/43.265677

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type: Journal Article

metadata version: 2023-07-06

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Víctor H. Champac, Antonio Rubio, Joan Figueras:
Electrical model of the floating gate defect in CMOS ICs: implications on I_DDQ testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(3): 359-369 (1994)

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