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"Compact Test Pattern Selection for Small Delay Defect."

Chia-Yuan Chang et al. (2013)

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DOI: 10.1109/TCAD.2013.2237946

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/ChangLHLR13
Chia-Yuan Chang, Kuan-Yu Liao, Sheng-Chang Hsu, James Chien-Mo Li, Jiann-Chyi Rau:
Compact Test Pattern Selection for Small Delay Defect. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(6): 971-975 (2013)

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