"Functional Test Generation Using Efficient Property Clustering and ..."

Mingsong Chen, Prabhat Mishra (2010)

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DOI: 10.1109/TCAD.2010.2041846

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type: Journal Article

metadata version: 2024-12-05

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Mingsong Chen, Prabhat Mishra:
Functional Test Generation Using Efficient Property Clustering and Learning Techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(3): 396-404 (2010)

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