"Optimal granularity of test generation in a distributed system."

Hideo Fujiwara, Tomoo Inoue (1990)

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DOI: 10.1109/43.57783

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type: Journal Article

metadata version: 2020-09-24

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Hideo Fujiwara, Tomoo Inoue:
Optimal granularity of test generation in a distributed system. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(8): 885-892 (1990)

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