"A low overhead design for testability and test generation technique for ..."

Indradeep Ghosh, Niraj K. Jha, Sujit Dey (1999)

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DOI: 10.1109/43.806811

access: closed

type: Journal Article

metadata version: 2020-10-26

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Indradeep Ghosh, Niraj K. Jha, Sujit Dey:
A low overhead design for testability and test generation technique for core-based systems-on-a-chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(11): 1661-1676 (1999)

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