"Reverse-order-restoration-based static test compaction for synchronous ..."

Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz (2003)

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DOI: 10.1109/TCAD.2002.807885

access: closed

type: Journal Article

metadata version: 2024-08-04

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Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
Reverse-order-restoration-based static test compaction for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 293-304 (2003)

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