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"Full-Chip Model for Leakage-Current Estimation Considering Within-Die ..."

Khaled R. Heloue, Navid Azizi, Farid N. Najm (2009)

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DOI: 10.1109/TCAD.2009.2016546

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/HeloueAN09
Khaled R. Heloue, Navid Azizi, Farid N. Najm:
Full-Chip Model for Leakage-Current Estimation Considering Within-Die Correlation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 874-887 (2009)

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