"Low Cost Hypercompression of Test Data."

Yu Huang et al. (2020)

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DOI: 10.1109/TCAD.2019.2945760

access: closed

type: Journal Article

metadata version: 2020-10-06

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Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang:
Low Cost Hypercompression of Test Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2964-2975 (2020)

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