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"Dynamic testability measures for ATPG."

André Ivanov, Vinod K. Agarwal (1988)

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DOI: 10.1109/43.3198

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/IvanovA88
André Ivanov, Vinod K. Agarwal:
Dynamic testability measures for ATPG. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(5): 598-608 (1988)

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