"Statistical Timing for Parametric Yield Prediction of Digital Integrated ..."

Jochen A. G. Jess et al. (2006)

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DOI: 10.1109/TCAD.2006.881332

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type: Journal Article

metadata version: 2020-09-24

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Jochen A. G. Jess, Kerim Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah:
Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2376-2392 (2006)

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