"Defect level estimation of circuit testing using sequential statistical ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Wen-Ben Jone (1993)

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DOI: 10.1109/43.205012

access: closed

type: Journal Article

metadata version: 2020-09-24

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Wen-Ben Jone:
Defect level estimation of circuit testing using sequential statistical analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(2): 336-348 (1993)

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