"Pattern generation for delay testing and dynamic timing ..."

Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng (2001)

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DOI: 10.1109/43.913759

access: closed

type: Journal Article

metadata version: 2022-12-07

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Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng:
Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(3): 416-425 (2001)

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