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"FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of ..."

Norio Kuji, Teruo Tamama, M. Nagatani (1986)

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DOI: 10.1109/TCAD.1986.1270201

access: closed

type: Journal Article

metadata version: 2020-09-24

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Norio Kuji, Teruo Tamama, M. Nagatani:
FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(2): 313-319 (1986)

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