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"Delay fault coverage, test set size, and performance trade-offs."

William K. C. Lam et al. (1995)

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DOI: 10.1109/43.363125

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/LamSBS95
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  - https://dblp.org/rec/journals/tcad/LamSBS95
William K. C. Lam, Alexander Saldanha, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli:
Delay fault coverage, test set size, and performance trade-offs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(1): 32-44 (1995)

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