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"On-Chip Self-Test Methodology With All Deterministic Compressed Test ..."
Kuen-Jong Lee, Bo-Ren Chen, Michael Andreas Kochte (2019)
- Kuen-Jong Lee
, Bo-Ren Chen
, Michael Andreas Kochte
:
On-Chip Self-Test Methodology With All Deterministic Compressed Test Patterns Recorded in Scan Chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(2): 309-321 (2019)
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