"AxFTL: Exploiting Error Tolerance for Extending Lifetime of NAND Flash ..."

Yongwoo Lee et al. (2020)

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DOI: 10.1109/TCAD.2020.3013070

access: closed

type: Journal Article

metadata version: 2022-12-19

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Yongwoo Lee, Jaehyun Park, Junhee Ryu, Younghyun Kim:
AxFTL: Exploiting Error Tolerance for Extending Lifetime of NAND Flash Storage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 3239-3249 (2020)

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