"Test set embedding for deterministic BIST using a reconfigurable ..."

Lei Li, Krishnendu Chakrabarty (2004)

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DOI: 10.1109/TCAD.2004.831593

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type: Journal Article

metadata version: 2022-01-03

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Lei Li, Krishnendu Chakrabarty:
Test set embedding for deterministic BIST using a reconfigurable interconnection network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1289-1305 (2004)

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