"Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: ..."

Qiao Li et al. (2022)

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DOI: 10.1109/TCAD.2022.3197487

access: closed

type: Journal Article

metadata version: 2023-09-30

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Qiao Li, Min Ye, Yufei Cui, Tianyu Ren, Tei-Wei Kuo, Chun Jason Xue:
Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4076-4087 (2022)

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