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"Thermal Aware Test Scheduling for NTV Circuit."

Jaeil Lim et al. (2018)

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DOI: 10.1109/TCAD.2017.2729282

access: closed

type: Journal Article

metadata version: 2024-02-27

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Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang:
Thermal Aware Test Scheduling for NTV Circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 906-910 (2018)

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