"Modeling, testing, and analysis for delay defects and noise effects in ..."

Jing-Jia Liou et al. (2003)

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DOI: 10.1109/TCAD.2003.811442

access: closed

type: Journal Article

metadata version: 2022-12-07

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Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng:
Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(6): 756-769 (2003)

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