"Reducing correlation to improve coverage of delay faults in scan-path design."

Weiwei Mao, Michael D. Ciletti (1994)

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DOI: 10.1109/43.277638

access: closed

type: Journal Article

metadata version: 2020-09-24

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Weiwei Mao, Michael D. Ciletti:
Reducing correlation to improve coverage of delay faults in scan-path design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(5): 638-646 (1994)

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