"More Efficient Testing of Metal-Oxide Memristor-Based Memory."

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis (2017)

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DOI: 10.1109/TCAD.2016.2608863

access: closed

type: Journal Article

metadata version: 2020-09-24

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Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis:
More Efficient Testing of Metal-Oxide Memristor-Based Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(6): 1018-1029 (2017)

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