"Signature analysis for analog and mixed-signal circuit test response ..."

Naveena Nagi et al. (1998)

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DOI: 10.1109/43.703834

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/NagiCYA98
Naveena Nagi, Abhijit Chatterjee, Heebyung Yoon, Jacob A. Abraham:
Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(6): 540-546 (1998)

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