"eWASM: Practical Software Fault Isolation for Reliable Embedded Devices."

Gregor Peach et al. (2020)

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DOI: 10.1109/TCAD.2020.3012647

access: closed

type: Journal Article

metadata version: 2020-12-17

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  - https://dblp.org/rec/journals/tcad/PeachPWPHC20
Gregor Peach, Runyu Pan, Zhuoyi Wu, Gabriel Parmer, Christopher Haster, Ludmila Cherkasova:
eWASM: Practical Software Fault Isolation for Reliable Embedded Devices. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 3492-3505 (2020)

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