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"Generation of Functional Broadside Tests for Logic Blocks With Constrained ..."

Irith Pomeranz (2013)

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DOI: 10.1109/TCAD.2012.2227258

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Generation of Functional Broadside Tests for Logic Blocks With Constrained Primary Input Sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(3): 442-452 (2013)

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