"Multicycle Broadside and Skewed-Load Tests for Test Compaction."

Irith Pomeranz (2020)

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DOI: 10.1109/TCAD.2018.2887049

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Multicycle Broadside and Skewed-Load Tests for Test Compaction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(1): 262-266 (2020)

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