"Broadside Tests for Transition and Stuck-At Faults."

Irith Pomeranz (2020)

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DOI: 10.1109/TCAD.2019.2935046

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Broadside Tests for Transition and Stuck-At Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(8): 1739-1743 (2020)

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