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"Property-based test generation for scan designs and the effects ofthe test ..."
Irith Pomeranz, Sudhakar M. Reddy (2002)
- Irith Pomeranz, Sudhakar M. Reddy:
Property-based test generation for scan designs and the effects ofthe test application scheme and scan selection on the number ofdetectable faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(5): 628-637 (2002)
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