"LFSR-Based Test Generation for Reduced Fail Data Volume."

Irith Pomeranz, Srikanth Venkataraman (2020)

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DOI: 10.1109/TCAD.2020.2971527

access: closed

type: Journal Article

metadata version: 2020-12-01

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Irith Pomeranz, Srikanth Venkataraman:
LFSR-Based Test Generation for Reduced Fail Data Volume. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 5261-5266 (2020)

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