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"Monitoring Aging Defects in STT-MRAMs."
Govind Radhakrishnan, Youngki Yoon, Manoj Sachdev (2020)
- Govind Radhakrishnan
, Youngki Yoon
, Manoj Sachdev:
Monitoring Aging Defects in STT-MRAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4645-4656 (2020)

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