"Monitoring Aging Defects in STT-MRAMs."

Govind Radhakrishnan, Youngki Yoon, Manoj Sachdev (2020)

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DOI: 10.1109/TCAD.2020.2982145

access: closed

type: Journal Article

metadata version: 2020-12-01

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  - https://dblp.org/rec/journals/tcad/RadhakrishnanYS20
Govind Radhakrishnan, Youngki Yoon, Manoj Sachdev:
Monitoring Aging Defects in STT-MRAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4645-4656 (2020)

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