"Compositional Probabilistic Analysis of Temporal Properties Over ..."

Ivan Ruchkin et al. (2020)

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DOI: 10.1109/TCAD.2020.3012643

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type: Journal Article

metadata version: 2025-03-03

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Ivan Ruchkin, Oleg Sokolsky, James Weimer, Tushar Hedaoo, Insup Lee:
Compositional Probabilistic Analysis of Temporal Properties Over Stochastic Detectors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 3288-3299 (2020)

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