"Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs."

Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan (2020)

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DOI: 10.1109/TCAD.2019.2907908

access: closed

type: Journal Article

metadata version: 2021-02-19

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Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan:
Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(4): 885-894 (2020)

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