"Techniques to Improve Write and Retention Reliability of STT-MRAM Memory ..."

Saravanan Sethuraman, Venkata Kalyan Tavva, M. B. Srinivas (2022)

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DOI: 10.1109/TCAD.2021.3118210

access: closed

type: Journal Article

metadata version: 2022-09-10

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Saravanan Sethuraman, Venkata Kalyan Tavva, M. B. Srinivas:
Techniques to Improve Write and Retention Reliability of STT-MRAM Memory Subsystem. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(9): 2901-2914 (2022)

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