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"Generation of test patterns without prohibited pattern set."

Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaudhuri (2004)

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DOI: 10.1109/TCAD.2004.837730

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/SikdarGC04
Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaudhuri:
Generation of test patterns without prohibited pattern set. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(12): 1650-1660 (2004)

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