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"Efficient SRAM Failure Rate Prediction via Gibbs Sampling."

Shupeng Sun et al. (2012)

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DOI: 10.1109/TCAD.2012.2209884

access: closed

type: Journal Article

metadata version: 2020-09-24

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Shupeng Sun, Yamei Feng, Changdao Dong, Xin Li:
Efficient SRAM Failure Rate Prediction via Gibbs Sampling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(12): 1831-1844 (2012)

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