"On diagnosing multiple stuck-at faults using multiple and singlefault ..."

Hiroshi Takahashi et al. (2002)

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DOI: 10.1109/43.986429

access: closed

type: Journal Article

metadata version: 2020-09-24

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Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu:
On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3): 362-368 (2002)

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