"A scalable scan-path test point insertion technique to enhance delay fault ..."

Seongmoon Wang, Srimat T. Chakradhar (2006)

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DOI: 10.1109/TCAD.2005.855929

access: closed

type: Journal Article

metadata version: 2020-09-24

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Seongmoon Wang, Srimat T. Chakradhar:
A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(8): 1555-1564 (2006)

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