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"Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of ..."

Zhanglei Wang, Krishnendu Chakrabarty (2008)

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DOI: 10.1109/TCAD.2007.907228

access: closed

type: Journal Article

metadata version: 2022-01-03

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Zhanglei Wang, Krishnendu Chakrabarty:
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 352-365 (2008)

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