"LT-RTPG: a new test-per-scan BIST TPG for low switching activity."

Seongmoon Wang, Sandeep K. Gupta (2006)

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DOI: 10.1109/TCAD.2005.855927

access: closed

type: Journal Article

metadata version: 2023-09-22

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Seongmoon Wang, Sandeep K. Gupta:
LT-RTPG: a new test-per-scan BIST TPG for low switching activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(8): 1565-1574 (2006)

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