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"Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch."

Kun Wu et al. (2023)

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DOI: 10.1109/TCAD.2022.3204716

access: closed

type: Journal Article

metadata version: 2023-12-25

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Kun Wu, Nanlin Guo, Fei Li, Nengyong Zhu, Jun Tao, Xin Li:
Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(5): 1618-1622 (2023)

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