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"Using an asymmetric error model to study aliasing in signature analysis ..."

Dhiren Xavier et al. (1992)

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DOI: 10.1109/43.108615

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/XavierAIA92
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  - https://dblp.org/rec/journals/tcad/XavierAIA92
Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal:
Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 16-25 (1992)

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