"Low-Power Scan Testing for Test Data Compression Using a Routing-Driven ..."

Dong Xiang et al. (2009)

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DOI: 10.1109/TCAD.2009.2018775

access: closed

type: Journal Article

metadata version: 2023-03-30

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Dong Xiang, Dianwei Hu, Qiang Xu, Alex Orailoglu:
Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(7): 1101-1105 (2009)

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