"The Detection of Open and Leakage Faults for Prebond TSV Test Based on ..."

Kangkang Xu, Yang Yu, Xu Fang (2022)

> Home

Details and statistics

DOI: 10.1109/TCAD.2021.3114357

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/XuYF22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/XuYF22
Kangkang Xu, Yang Yu, Xu Fang:
The Detection of Open and Leakage Faults for Prebond TSV Test Based on Weak Current Source. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(9): 2768-2779 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.