"Fast detection of data retention faults and other SRAM cell open defects."

Josh Yang et al. (2006)

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DOI: 10.1109/TCAD.2005.852680

access: closed

type: Journal Article

metadata version: 2020-09-24

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Josh Yang, Baosheng Wang, Yuejian Wu, André Ivanov:
Fast detection of data retention faults and other SRAM cell open defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(1): 167-180 (2006)

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