"A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic ..."

Manuel J. Barragán et al. (2016)

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DOI: 10.1109/TCSI.2016.2602387

access: closed

type: Journal Article

metadata version: 2023-06-28

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Manuel J. Barragán, Rshdee Alhakim, Haralampos-G. D. Stratigopoulos, Matthieu Dubois, Salvador Mir, Hervé Le Gall, Neha Bhargava, Ankur Bal:
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(11): 1876-1888 (2016)

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