"Sensing Margin Enhancement Techniques for Ultra-Low-Voltage SRAMs ..."

Anh-Tuan Do et al. (2012)

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DOI: 10.1109/TCSII.2012.2231014

access: closed

type: Journal Article

metadata version: 2021-07-25

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Anh-Tuan Do, Truc Quynh Nguyen, Kiat Seng Yeo, Tony Tae-Hyoung Kim:
Sensing Margin Enhancement Techniques for Ultra-Low-Voltage SRAMs Utilizing a Bitline-Boosting Current and Equalized Bitline Leakage. IEEE Trans. Circuits Syst. II Express Briefs 59-II(12): 868-872 (2012)

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