"On Diagnosing the Aging Level of Automotive Semiconductor Devices."

Jihun Jung et al. (2017)

> Home

Details and statistics

DOI: 10.1109/TCSII.2016.2601959

access: closed

type: Journal Article

metadata version: 2020-05-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/JungAKYP17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/JungAKYP17
Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs 64-II(7): 822-826 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.